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Single-Electron Box Fabrication on Scanning Probe Tip for High-Resolution Electric Charge Detection

Description: This technology presents novel fabrication methods for a single-electron box (SEB) integrated onto a scanning probe tip, utilizing atomic force microscopy (AFM) to measure electric forces rather than current for improved detection sensitivity and simplified operation. Two advanced fabrication techniques are developed, involving platinum-coated...

Published: 11/13/2025 | Inventor(s): Yoichi Miyahara, Binod D.C.

Keywords(s): Nanotechnology, Quantum Measurement Devices

Category(s): Nanotechnology